Description
Analytical services for the application of high resolution scanning electron microscopy JEOL JSM-7001F
Analytical services for the application of raster electron microscopy with the systems of combined energy dispersive and wave microanalysis, backscattered electron diffraction, cathodoluminescence FEI Quanta 200
Analytical services for the use of NT-MDT Ntegra Prima scanning probe microscopy
Analytical Services for the Application of Transmission Electron Microscopy JEOL JEM-2100
Analytical services for the use of x-ray diffractometer THERMO ARL X'TRA